The atomic force microscope (AFM) is capable of imaging local material properties such as topology, friction, electrostatic interaction, electrical conductivity, magnetism etc. The image of a selected area is obtained by detecting the force between the probe and the sample. nanoMETRONOM® AFM systems utilize novel thermomechanical (self-transduced) and piezoresistive (self-sensed using 2DEG read-out) cantilevers for rapid non-contact imaging.

• Modular system components include damping, environmental chamber, positioning stage

• SmartActiveProbe (cantilever) with active thermomechanical actuation for atomic resolution

• Fastest SPM system in vacuum, air, and liquid

• Cantilever head for fast plug-and-play cantilever exchange

• Scanner and probe can be can be easily adapted to customer’s requirements

  FUNCTIONS
  Operation Mode	AC mode / DC mode
  Topography Imaging	YES
  Amplitude / Phase Imaging	YES
  Force Curve Chart	YES
  Sample / Probe Approach	Automatic
  Probe tuning	Automatic
  Detection Principle	Piezoresistive
  Resolution Amplitude / Phase	16-bit
  Feedback control platform	Realtime FPGA
  Front End Bandwidth	8 MHz
  Simultaneous Images	Phase, frequency, amplitude, topography
  Measurement Modes	MFM, EFM, PFM, C-AFM, SThM